atpg flow(tessent)

atpg flow(tessent)

DFT Library

atpg flow(tessent)

 

 

 atpg flow(tessent)

 

 

 

DFT Library 的自动产生

atpg flow(tessent)

 libcomp <verilog_file> -dofile <file_name>

 

Black Boxes

add_black_box -auto     black box所有没有被定义的module,该命令使用在setup模式中

atpg flow(tessent)
###自定义add
SETUP> add_ black boxes -module core
SETUP> add black boxes -instance /instA -pin Aout z
###Delect
SETUP> delete_black_boxes -module core
SETUP> delete_black_boxes -All
###report
SETUP>report black boxes -All
example

 

ATPG Setup

需要准备的文件:

gate-level 、scan-inserted netlist

test procedure file——描述测试过程,怎么setup,怎么load等

setup file: dofiles ——约束信号、哪些是clock哪些reset…、scan结构等

DFT library

 

test procedure file:

timeplates    时序行为的描述:测试周期多大、primitive input在哪个点force值,primitive output在哪个时刻点measure它的值、clock波形怎么样的

test_setup(initiallzation)    描述测试准备前的工作:设计里配置过程比如触发器配到110才能进入test mode

load_unload/shift    描述scan chain怎么操作的

capture event and processes    定义capture过程中clock怎么动

示例:

 

 

 

atpg flow(tessent)

 

 

 

 dofile

atpg flow(tessent)

atpg flow(tessent)

 

 

 

setup> analyze_control_signals -auto_fix        可自动定义clock

stil2mac -stil cpucore.stp -tpf cpucore.tpf -dofile cpucore.do        STIL --> dofile and testpro

ATPG PROCESS

atpg flow(tessent)

 

 

DRC

 

RAM rules(A)、Clock rules(C)、Data rules(D)、Extra rules(E)、EDT Finder rules(F)、Flattening rules(FN/FP/FG)、General rules(G)、Procedure rules(P)、Scannability(S)、Scan chain trace rules(T)、Timing rules(W)

具体介绍可查阅tshell_ref - chr7 

setup>set drc_handling       把某个error降级为warning

Generate Pattern

 create_pattern     自动加载所有fault点去生成pattern,也可以使用add_faults去指定fault

Save Results

 patterns

ascii/binary  用于debug

verilog     用于验证,time-based simulation

WGL/STIL    给ATE测试

write_patterns <filename> <format_switch> -replace

flat model

用于后续诊断

write_flat_model <filename>  -replace

 

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